旭光通商株式会社 > 製品情報 > 光計測機器 > レンズMTF測定器、画像MTF測定機、その他 > イメージングMTF測定システム I-siteシステム

イメージングMTF測定システム I-siteシステム

イメージングMTF測定システム I-siteシステム
  • ●全般の撮像装置の画像MTFの評価を提供
  • ●特許取得のVI-siteソフトウェアによる高信頼性測定
  • ●OLEインターフェースによるVisual Basic,C++利用
  • ●2D投影によりリアルタイム測定
  • ●Uv~LWIRに対応
測定できる単位:LSF,MTF,SiTF,NPS,RMS,NEL,MRC,MDC,NETD,NER,MRTD, MDTD,3Dノイズ、D,jitter,FOV,FOV変化量など
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製品情報

概要

Optikos社が提供するI-siteシステムは、CCDカメラ、デジタルカメラ、ビデオカメラ、赤外線サーモビュアー、赤外線カメラ、ナイトビジョンシステム、赤外放射計、熱赤外カメラ、ディスプレイといった電子撮像装置全般のイメージングパラメータの評価を可能にする測定システムです。

Optikos社が提供する各種ハードウェア、コンポーネント及び光源はI-siteシステムの心臓部であるI-siteソフトウェアによって統合されます。I-siteシステムはユーザーのニーズに合わせてUVからLWIRの熱赤外までに対応または拡張が可能で、様々な電子撮像装置から直接の画像情報をチェーン信号処理の各ポイントで測定評価することが可能です。

測定項目

VISアプリケーション

  • LSF
  • MTF
  • SiTF
  • ノイズパワースペクトル NPS
  • RMS
  • NEL
  • MRC

赤外アプリケーーション

  • 雑音等価温度差 NETD
  • 騒音同等輝度 NER
  • 最少分解可能温度差 MRTD
  • 最少検出可能温度差 MDTD
  • 3Dノイズ
  • LSF
  • MTF
  • NPS

APPLICATIONS

I-SITE™ tests the performance of:

  • Video cameras
  • Digital imaging systems
  • Displays
  • Photographic systems
  • Visual imaging systems
  • Fiberoptic faceplates
  • Night vision systems
  • Thermal imagers
  • Imaging radiometers
  • Imaging intensifiers
  • Thermographic systems
Figure 1: I-SITE™ toolbar with easy access to I-SITE™ measurement functions.

Figure 1: I-SITE™ toolbar with easy access to I-SITE™ measurement functions.

Figure 2: With 2D I-SITE™ MTF, 4-bar MTF of a FLIR can be measured
in real-time.
Figure 2: With 2D I-SITE™ MTF, 4-bar MTF of a FLIR can be measured
in real-time.

Figure 2: With 2D I-SITE™ MTF, 4-bar MTF of a FLIR can be measured in real-time.

Benefits

  • Captures data directly from many optical images or video signals
  • Expands to accommodate new types of measurements
  • Readily upgraded to support additional hardware modules
  • Can be integrated into a manufacturing environment

Features

  • Measures throughout the signal processing chain
  • OLE interfaces through Visual Basic®, C++, and others
  • Setup, results, and calibration data can be printed or output to files
  • Interactive real-time 2D video screen (with 2D devices)
Figure 3: The multiple window interface allows several test parameters
and results to be viewed simultaneously.
Figure 3: The multiple window interface allows several test parameters
and results to be viewed simultaneously.

Figure 3: The multiple window interface allows several test parameters and results to be viewed simultaneously.

CREATING MACRO PROGRAMS

I-SITE™ software provides OLE interfaces for users to create optical testing macro programs. Third party industry standard tools, such as Microsoft® Visual Basic®, National Instruments LabVIEW and Sybase PowerBuilder can be used to access many I-SITE™ functions. Macro programs allow seamless integration with application programs such as Microsoft® Excel and Access®. The ability to create stand-alone programs is a standard feature of I-SITE™ software and samples are provided. Applications range from simple “go/no-go” macros, to more elaborate programs linking bar-coded lot information to MTF measurements. Access to I-SITE™ functions gives you unparalleled flexibility and power in building your quality control infrastructure. Figure

Figure 4: Objective MRTD can be measured using single-button
operation.

Figure 4: Objective MRTD can be measured using single-button operation.

Figure 5: Components of MRTD, such as SiTF and NPS,
can be separately analyzed to further evaluate system
performance.
Figure 5: Components of MRTD, such as SiTF and NPS,
can be separately analyzed to further evaluate system
performance.

Figure 5: Components of MRTD, such as SiTF and NPS, can be separately analyzed to further evaluate system performance.

SUPPORTED MEASUREMENTS

I-SITE™ systems support the following electro-optical measurements:

  • Line Spread Function (LSF)
  • Modulation Transfer Function (MTF)
  • Signal Transfer Function (SiTF)
  • Noise Power Spectrum (NPS)
  • Root Mean Square Noise (RMS)
  • Noise Equivalent Luminance (NEL)
  • Minimum Resolvable Contrast (MRC)
  • Minimum Detectable Contrast (MDC)

For Infrared Systems:

  • Noise Equivalent Temperature Difference (NETD)
  • Noise Equivalent Radiance (NER)
  • Minimum Resolvable Temperature Difference (MRTD)
  • Minimum Detectable Temperature Difference (MDTD)
  • 3D Noise
  • Line Spread Function (LSF)
  • Modulation Transfer Function (MTF)
  • Signal Transfer Function (SiTF)
  • Noise Power Spectrum (NPS)
  • Root Mean Square Noise (RMS)
  • Detector Detectivity (D*)
  • Bolt Down Boresighting
  • Multiple FOV Boresighting
  • 1D-2D Non-uniformity
  • Jitter
  • Narcissus
  • Field of View (FOV)
  • FOV Change
  • Thermal Imager Multiple

MEASUREMENT DEVICES

A measurement device for the Optikos I-SITE™ system is the part of the test equipment that acquires the image or signal from the system under test and transmits it to the computer for analysis. An optical measurement device is used in an electro-optical imaging system where the output of the unit under test is an optical image, such as a display device. Conversely, an electronic measurement device is used in an electro-optical imaging system where the output is an electronic signal, such as a CCD camera.

For a system under test that outputs its signal to a display device, such as a CRT or LCD, an I-SITE system uses the PMC-600 Photometric Camera. The PMC-600 acquires a 2-dimensional image produced by the system being tested. Three software and hardware products are offered: I-SITE™ MTF 1D acquires a single video line from either 1D or 2D analog cameras, MTF 2D Analog acquires the 2D image from the video signal of an analog camera, and I-SITE™ MTF 2D Digital acquires the signal from a digital camera.

Figure 6: Oversampling ensures accurate LSF and MTF measurements.

Figure 6: Oversampling ensures accurate LSF and MTF measurements.

Sampling Rule of Thumb

As a general rule of thumb the I-SITE™ system oversamples the unit under test by a factor of ten. That is to say, in making MTF and LSF measurements on a CCD array or other camera, the image of the slit should move across the face of the detector in steps no larger than 1/10 the dimension of the detector. Oversampling the signal from the unit under test assures accurate characterization of the signal. This is achieved electronically by using a high sampling rate, and is achieved optically

Figure 7: I-SITE™ system measurement devices can measure an electro-optical system at multiple points along the signal path.

Figure 7: I-SITE™ system measurement devices can measure an electro-optical system at multiple points along the signal path.

 

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