Model QCB-50-AOA is a cost-effective solution to your production

and prototype lens qualification needs. Optikos, the leader in

image quality test equipment, is pleased to offer this compact,

easy-to-use quality control tool.  The QC bench is a turnkey

system designed for both laboratory and industrial quality

assurance measurement environments. Real-time MTF testing

and and analysis enables system integration to qualify

incoming product quickly and reliably, thereby minimizeing

the risk of sub-standard complete assemblies.

WavePro analyzers measure wavefront using the Shack-Hartmann

techniques, Alenslet array samples the incoming warefront,

creating an image of spots on a CCD camera.  A change in

wavefront will shift spot positions.  By measuring these shifts,

the wavefront is calculated along with standard optical

parameters such as Zernike coefficients, aberrations, and MTF.

WavePro Wavefront Analyzers are real-rime analysis tools for

wavefront phase measurement based on Shack-Hartmann

technology. The WavePro Analyzer enable beam quality testing

of fiberoptic devices throughout manufacturing processes. 

These analyzers are designed to improve product quality, increase

production yields, and isolate assembly problems.  Flexible

operating software allows the WavePro analyzers to be part of

any automated manufacturing process.

The SMI measures surface shape deviations of precision surfaces

using wavefront analysis technology.  Configured to measure

such items as: micro-optics, ball lenses, and contact lens molds,

the instrument allows users to easily measure aspheric and toric

parts without the need for reference surfaces.  From optics to metal tooling, the SMI measures radius of curvature, toric radii

and axis, conic constant and surface irregularities. Full surface

maps reveal shape errors to within fractions of a micrometer.

The SMI compares the wavefront reflected from the surface to

that expected from a perfect sphere.  The surface deviation

is expressed in the form of characteristics circular  functions called

the Zernike measure shape departures better than 0.1 μm and

fradius better than 3 μm.